High Quality Standard In-Line 2DAOI For SMT Production Line

PRODUCT FEATURES

Vector analysis algorithm,integrated variety of software algorithms to achieve the best inspection capability
Industria camera,multiple specifications for selection
The new light source design,effectively eliminate the NG parts.
Offline programming and debugging
The equipment can communicate directly with the NG BUFFER device and other equipment through the communication protocol
Central server mode that gathers information from all the test machines to facilitate the integrated management of production.multi-machines need only one operator

CATEGORY

ITEM

S810/S820/S830 S810L/S820L/S830L

Recognition System

Inspection

Al Intellgent detecton algorithmt,he vector imege alorthmsinclude logic operation,dilstance of uminance boundary,chip tracing.OCR/OCV,uminance/clor template mathing,clor dlstance,color extractlon (RGB &HSV,value-range of luminance,offset ofluminance,the minimum varation span of luminance,etc…. More than 30 kinds of the most advanced algorithms

Camera

5MP/High performance 5MP/12MP (20 and 25MPoptional)

Lens

High-resolution telecentic Lens,20μm,15μm,12um,10um,8um for optión

Lamp-house

Ring tower structure,high intensty RGBW flash lighting

FOV

48.96×40.96mm(5MP&20μm)/36.72×30.72 mm(5MP&15μm)

50×45mm(12MP&15μm)740×30mm(12MP&10μm)

0201 Chip

<7.6ms

Pr-image Time

220～450ms

Paste Printing Defects

Missing,overlow,insuffcent,pasting open,stain

Component Defects

Missing.sift,skewed,tombstone,bllboard,overtumed,reversed polarity,wrong.damaged

Sclder Defects

Overflow,insficient,short solder,stain

Wave Soklering Inspect

Overlow,insuficent,short,exce5 salde,salder void

Inspection Items

0201&0.4mm pitch(20μm) 01005&0.3mm pitch(15μm)

Al Intelligent Recognition and various vector image algorithms to get the best inspection capability

By using Al to automatically build a database,automatically
configure detection thresholds,and integrate traditional
vector analysis algorithms,It can achieve efficient
programming and optimal configuration of detection
algorithms,thereby improving programming efficiency while
ensuring detection capabilities

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